Products & Services

    Test Wafers

    Analysis Software

    Metrology Service

    Defect Characterization
    & E-Testing Services

 


 

 
SKW 7 Metrology Guideline
General Guideline for Optical Measurement Sites
There are several different sampling plans to effectively characterize the CMP process at hand with varying degrees of quality and efficiency.

Generally, we recommend that first sampling plan with three dies to any customer who performs the measurements manually (e.g. Nanospec Manual Optical Measurement tool).

For those using automated tools (e.g. Thermawave Opti-Probe or KLA/Tencor UV1250, P-Series), we recommend the second sampling plan (medium quality) with eight sites in the up and down regions measured on five dies.

We have found that this plan provides the best trade-off between quality and efficiency (time and cost) to our customers. The remaining plan is largely for those interested in very detailed measurements of the wafers.
Manual Measurement Plan - 3 Up and 3 Down Sites on 1, 3, or 5 Dies
Automated Medium Quality Plan - 8 Up Sites and 8 Down Sites on 3 or 5 Dies
Automated High Quality Plan - 22 Up Sites and 22 Down Sites on 3 or 5 Dies
Up / Down site (Cross Sectional View)
Manual Measurement Sampling Plan top
Site Information for Manual Measurement Plan
Site # Up Area Down Area Pattern
Density
(%) 		Pitch
(um)
X (um) Y (um) X (um) Y (um)
1 2005 2000 2055 2000 10 -
2 14045 6000 14095 6000 90 -
3 14013 14000 14038 14000 50 50
* X, Y coordinates are relavant to lower left corner of each die.
* Site numbers proceed from left to right and down to up sturctures.
Automated Medium Quality Measurement Sampling Plan top
Site Information for Medium Quality Measurement Plan
Site # Up Area Down Area Pattern
Density
(%) 		Pitch
(um)
X (um) Y (um) X (um) Y (um)
1 2005 2000 2055 2000 10 -
2 10020 2000 10070 2000 40 -
3 14030 2000 14080 2000 60 -
4 14045 6000 14095 6000 90 -
5 10015 10000 10065 10000 30 -
6 14035 10000 14085 10000 70 -
7 14013 14000 14038 14000 50 50
8 18125 18000 18375 18000 50 500
Automated High Quality Measurement Sampling Plan top
Site Information for High Quality Measurement Plan
Site # Up Area Down Area Pattern
Density
(%) 		Pitch
(um)
X (um) Y (um) X (um) Y (um)
1 2005 2000 2055 2000 10 -
2 6010 2000 6060 2000 20 -
3 10020 2000 10070 2000 40 -
4 14030 2000 14080 2000 60 -
5 18040 2000 18090 2000 80 -
6 2015 6000 2065 6000 30 -
7 6025 6000 6075 6000 50 -
8 10035 6000 10085 6000 70 -
9 14045 6000 14095 6000 90 -
10 2005 10000 2055 10000 10 -
11 6045 10000 6095 10000 90 -
12 10015 10000 10065 10000 30 -
13 14035 10000 10065 10000 70 -
14 18025 10000 18075 10000 50 -
15 10002.5 14000 10007.5 14000 50 10
16 14012.5 14000 14037.5 14000 50 50
17 18025 14000 18075 14000 50 100
18 2005 18000 2015 18000 50 20
19 6020 18000 6060 18000 50 80
20 10007.5 18000 10022.5 18000 50 30
21 14050 18000 14150 18000 50 200
22 18125 18000 18375 18000 50 500 

 
 
SKW Associates, Inc.